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Tag: Keyence

Process, Quality Control

Triple Scan Enables Nanometer, Micrometer, and Millimeter Measurements

March 30, 2021

Via: Metrology and Quality News

Keyence has announced that it has added white light interferometry to its 3D Surface Profiler VK-X3000 Series providing capabilities to measure from nanometers to millimeters. Highly accurate measurement of any target is now possible through the use of three different […]