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Triple Scan Enables Nanometer, Micrometer, and Millimeter Measurements

March 30, 2021

Keyence has announced that it has added white light interferometry to its 3D Surface Profiler VK-X3000 Series providing capabilities to measure from nanometers to millimeters. Highly accurate measurement of any target is now possible through the use of three different measurement principles namely laser confocal, white light interferometry, and focus variation.

Triple Scan Approach Enables Measurement of Any Target

The 3D Surface Profiler allows users to capitalize on three different scanning methods in a single device. Selecting the best scanning method for the target material, shape, and measurement range ensures high-accuracy measurement on virtually any high-precision part.

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