Top

USTR Tai to AAM: U.S. Trade Policy Should Reinforce Our Ability to Make Things in America...

GM Says Strike Cost $1.1 Billion, but Raises Dividend

Semis down 12% this year; up 20% next year, says IDC

China's Overcapacity in Clean Energy is Causing Global Problems. How Will the U.S. Respond?...

Nikon Selects Aeva in Multi-year Production Agreement to Power Next Generation of High Precision Industrial Metrology Inspection Products...

Tag: 3D Surface Profiler VK-X3000 Series

Process, Quality Control

Triple Scan Enables Nanometer, Micrometer, and Millimeter Measurements

March 30, 2021

Via: Metrology and Quality News

Keyence has announced that it has added white light interferometry to its 3D Surface Profiler VK-X3000 Series providing capabilities to measure from nanometers to millimeters. Highly accurate measurement of any target is now possible through the use of three different […]